Last update: Sept. 30, 2003

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SHAPE - Seminar

Independent Component Analysis for Texture Defect Detection and Face Recognition

Professor Aytul Ercil

Comp. Vision & Pattern Analysis Lab., Sabanci Universitesi, Turkey.

Thursday October 2, 2003, noon

Barus-Holley, Room 190

Organized by the SHAPE Lab. and the Engineering Division


Abstract

In this talk, we will review the concept of Independent Component Analysis and present the results of the application of this techniques to two problems. The first problem is texture defect detection where the results demonstrating the use of this method for visual inspection of textile products obtained from a real factory environment will be presented. We will also explore the independent components and the wavelet sub-bands that increase face recognition performance and that are purportedly robust against expression variations and differences in illumination.


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